01639nam a2200409Ia 4500 EBC430981 MiAaPQ 20250821104538.0 m o d | cr cnu|||||||| 940915s1995 nyua ob 000 0 eng d 9780195358469 (electronic bk.) 9780195088748 (print) (MiAaPQ)EBC430981 (Au-PeEL)EBL430981 (CaPaEBR)ebr10358552 (CaONFJC)MIL53489 (OCoLC)435816746 MiAaPQ eng rda pn MiAaPQ MiAaPQ QH212.E4 J67 1995 502/.8/25 20 Joy, David C., 1943- 197801 Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy. New York : Oxford University Press, 1995. viii, 216 p. : ill. Oxford series in optical and imaging sciences ; 9 Includes bibliographical references. Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Electron microscopy Computer simulation. 197802 Electron probe microanalysis Computer simulation. 197803 Monte Carlo method. 197804 Electronic books. 35142 ProQuest (Firm) 197805 ProQuest (Firm) Oxford series in optical and imaging sciences ; 9. 197806 https://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=430981 Click to View 248771 248771