01492nam a2200373Ia 4500 EBC479860 MiAaPQ 20250821110253.0 m o d | cr cnu|||||||| 081027s2009 si a ob 001 0 eng d 9780470824085 (electronic bk.) 9780470824078 (print) (MiAaPQ)EBC479860 (Au-PeEL)EBL479860 (CaPaEBR)ebr10325826 (CaONFJC)MIL238218 (OCoLC)669008259 MiAaPQ eng rda pn MiAaPQ MiAaPQ TK7871.99.M44 K47 2009 Ker, Ming-Dou. 242455 Transient-induced latchup in CMOS integrated circuits [electronic resource] / Ming-Dou Ker and Sheng-Fu Hsu. Singapore ; Hoboken, NJ : Wiley, c2009. xiii, 249 p. : ill. Includes bibliographical references and index. Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Metal oxide semiconductors, Complementary Defects. 242456 Metal oxide semiconductors, Complementary Reliability. 242457 Electronic books. 35142 Hsu, Sheng-Fu. 242458 ProQuest (Firm) 242459 ProQuest (Firm) https://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=479860 Click to View 256154 256154