TY  - BOOK
AU  - Ker,Ming-Dou
AU  - Hsu,Sheng-Fu
ED  - ProQuest (Firm)
TI  - Transient-induced latchup in CMOS integrated circuits
SN  - 9780470824085
AV  - TK7871.99.M44 K47 2009
PY  - 2009///
CY  - Singapore, Hoboken, NJ
PB  - Wiley
KW  - Metal oxide semiconductors, Complementary
KW  - Defects
KW  - Reliability
KW  - Electronic books
N1  - Includes bibliographical references and index
UR  - https://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=479860
ER  -