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  <titleInfo>
    <title>Reliability of MEMS</title>
    <subTitle>testing of materials and devices</subTitle>
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  <name type="personal">
    <namePart>Tabata, Osamu.</namePart>
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  <name type="personal">
    <namePart>Tsuchiya, Toshiyuki.</namePart>
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    <dateIssued>2013</dateIssued>
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    <extent>xx, 303 p. : ill.</extent>
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  <note type="statement of responsibility">edited by Osamu Tabata, Toshiyuki Tsuchiya.</note>
  <note>First edition 2007.</note>
  <note>Includes bibliographical references and index.</note>
  <subject authority="lcsh">
    <topic>Microelectromechanical systems</topic>
    <topic>Reliability</topic>
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  <classification authority="lcc">TK7875 .R45 2013</classification>
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  <identifier type="isbn">9783527675036</identifier>
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