01704nam a2200421 a 4500 EBC697681 MiAaPQ 20250821113849.0 m o d | cr cnu|||||||| 110415s2011 enkacd ob 001 0 eng d 9781119997306 (electronic bk.) 9780470978696 (print) (MiAaPQ)EBC697681 (Au-PeEL)EBL697681 (CaPaEBR)ebr10484809 (CaONFJC)MIL317798 (OCoLC)746324291 MiAaPQ eng rda pn MiAaPQ MiAaPQ TK7875 .D54 2011 621.381 22 Digital holography for MEMS and microsystem metrology [electronic resource] / edited by Anand Asundi. Chichester, West Sussex, U.K. ; Hoboken, N.J. : Wiley, 2011. xxii, 205 p. : ill., port. The Wiley microsystem and nanotechnology series Includes bibliographical references and index. Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Microelectromechanical systems Measurement. 335302 Microelectronics Measurement. 335303 Holographic testing. 335304 Image processing Digital techniques. 335305 Electronic books. 35142 Asundi, Anand. 335306 ProQuest (Firm) 335307 ProQuest (Firm) Wiley microsystem and nanotechnology series. 335308 https://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=697681 Click to View 271881 271881