01704nam a2200421 a 4500001001000000003000700010005001700017006001900034007001500053008004100068020003600109020002700145035002200172035002300194035002500217035002300242035002100265040004100286050002200327082001600349245010800365260006800473300003200541490005200573504005100625590014700676650005700823650004300880650003300923650005000956655002901006700002701035710002801062797002001090830005701110856009601167999001901263EBC697681MiAaPQ20250821113849.0m     o  d |      cr cnu||||||||110415s2011    enkacd  ob    001 0 eng d  a9781119997306q(electronic bk.)  z9780470978696q(print)  a(MiAaPQ)EBC697681  a(Au-PeEL)EBL697681  a(CaPaEBR)ebr10484809  a(CaONFJC)MIL317798  a(OCoLC)746324291  aMiAaPQbengerdaepncMiAaPQdMiAaPQ 4aTK7875b.D54 20110 a621.38122200aDigital holography for MEMS and microsystem metrologyh[electronic resource] /cedited by Anand Asundi.  aChichester, West Sussex, U.K. ;aHoboken, N.J. :bWiley,c2011.  axxii, 205 p. :bill., port.1 aThe Wiley microsystem and nanotechnology series  aIncludes bibliographical references and index.  aElectronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 0aMicroelectromechanical systemsxMeasurement.9335302 0aMicroelectronicsxMeasurement.9335303 0aHolographic testing.9335304 0aImage processingxDigital techniques.9335305 4aElectronic books.9351421 aAsundi, Anand.93353062 aProQuest (Firm)93353072 aProQuest (Firm) 0aWiley microsystem and nanotechnology series.933530840uhttps://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=697681zClick to View  c271881d271881