01848nam a2200445 a 4500001001100000003000700011005001700018006001900035007001500054008004100069010001700110020002500127020002200152020003500174035002300209035002400232035002500256035002300281035002100304040002700325050002200352082001600374245010900390260005000499300002300549504004100572505022600613533014700839650004400986650004301030650002201073650003401095655002901129700002601158700004001184700003401224710002801258856009701286999001901383EBC1109848MiAaPQ20250821123602.0m     o  d |      cr cn|||||||||110706s2010    ne a    sb    000 0 eng d  z  2011377691  z9789004190948 (hbk.)  z9004190945 (hbk.)  a9789004190955 (electronic bk.)  a(MiAaPQ)EBC1109848  a(Au-PeEL)EBL1109848  a(CaPaEBR)ebr10644872  a(CaONFJC)MIL501668  a(OCoLC)827211774  aMiAaPQcMiAaPQdMiAaPQ 4aTK7875b.A34 201004a621.38122200aAdhesion aspects in MEMS/NEMSh[electronic resource] /cedited by S.H. Kim, M.T. Dugger and K.L. Mittal.  aLeiden [Netherlands] ;aBoston :bVSP,c2010.  axi, 409 p. :bill.  aIncludes bibliographical references.0 apt. 1. Understanding through continuum theory -- pt. 2. Computer simulation of interfaces -- pt. 3. Adhesion and friction measurements -- pt. 4. Adhesion in practical applications -- pt. 5. Adhesion mitigation strategies.  aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 0aMicroelectromechanical systems.9480303 0aNanoelectromechanical systems.9480304 0aAdhesion.9480305 0aSurfaces (Technology)9480306 4aElectronic books.9351421 aKim, Seong H.94803071 aDugger, M. T.q(Michael T.)94803081 aMittal, K. L.,d1945-94803092 aProQuest (Firm)948031040uhttps://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=1109848zClick to View  c296633d296633