Servin, Manuel, <br/><br/>
Fringe pattern analysis for optical metrology :  theory, algorithms, and applications / 
Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. 
 - 1 online resource (345 pages) :  illustrations 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9783527681082 9783527681105 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Diffraction patterns--Data processing.<br/>Image processing--Data processing.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QC415  / .S478 2014 
<br/><br/><label>Dewey Class. No.: </label>621.36