02190nam a2200493 i 4500 EBC1701414 MiAaPQ 20250821132814.0 m o d | cr cnu|||||||| 140620t20142014gw a ob 001 0 eng d 9783527411528 9783527681099 (Mobi) 9783527681075 (oBook) 9783527681082 (electronic bk.) 9783527681105 (electronic bk.) (MiAaPQ)EBC1701414 (Au-PeEL)EBL1701414 (CaPaEBR)ebr10881255 (CaONFJC)MIL615339 (OCoLC)881028799 MiAaPQ eng rda pn MiAaPQ MiAaPQ QC415 .S478 2014 621.36 23 Servin, Manuel, author. 602740 Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014. 2014 1 online resource (345 pages) : illustrations text rdacontent computer rdamedia online resource rdacarrier Includes bibliographical references and index. Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014). Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Diffraction patterns Data processing. 602741 Image processing Data processing. 602742 Electronic books. 35142 Quiroga, J. Antonio, author. 602743 Padilla, J. Moises, author. 602744 Print version: Servin, Manuel. Fringe pattern analysis for optical metrology : theory, algorithms, and applications. Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, c2014 xvi, 327 pages 9783527411528 ProQuest (Firm) https://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=1701414 Click to View 319761 319761