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    <title>Fringe pattern analysis for optical metrology</title>
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    <namePart>Servin, Manuel</namePart>
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    <namePart>Quiroga, J. Antonio</namePart>
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  <name type="personal">
    <namePart>Padilla, J. Moises</namePart>
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  <note type="statement of responsibility">Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.</note>
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    <topic>Diffraction patterns</topic>
    <topic>Data processing</topic>
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    <topic>Data processing</topic>
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