Rumiantsev, Andrej, <br/><br/>
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / 
Andrej Rumiantsev. 
 - 1 online resource (278 pages). 
 - River publishers series in electronic materials and devices .
 - River Publishers series in electronic materials and devices. .
<br/><br/><label>ISBN: </label>9788770221115 (e-book) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Characterization.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7871.85  / .R865 2019 
<br/><br/><label>Dewey Class. No.: </label>621.38152