01746nam a2200373 i 4500001001100000003000700011005001700018006001900035007001500054008004100069020001800110020002700128035002300155035002400178035002200202040004100224050002600265082001800291100003300309245016100342264007200503264000900575300003500584336002600619337002600645338003600671490006400707588004700771650003800818655002200856776033200878830006501210856009701275EBC5829253MiAaPQ20250828011548.0m     o  d |      cr cnu||||||||190808s2019    dk      o     000 0 eng d  z9788770221122  a9788770221115 (e-book)  a(MiAaPQ)EBC5829253  a(Au-PeEL)EBL5829253  a(OCoLC)1119628796  aMiAaPQbengerdaepncMiAaPQdMiAaPQ 4aTK7871.85b.R865 20190 a621.381522231 aRumiantsev, Andrej,eauthor.10aOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /cAndrej Rumiantsev. 1aGistrup, Denmark ;aDelft, Netherlands :bRiver Publishers,c[2019] 4c2019  a1 online resource (278 pages).  atextbtxt2rdacontent  acomputerbc2rdamedia  aonline resourcebcr2rdacarrier1 aRiver publishers series in electronic materials and devices  aDescription based on print version record. 0aSemiconductorsxCharacterization. 4aElectronic books.08iPrint version:aRumiantsev, Andrej.tOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond.dGistrup, Denmark ; Delft, Netherlands : River Publishers, c2019 h278 pages kRiver publishers series in electronic materials and devices.z9788770221122 0aRiver Publishers series in electronic materials and devices.40uhttps://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=5829253zClick to View