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Advanced production testing of RF, SoC, and SiP devices [electronic resource] / Joe Kelly, Michael Engelhardt.

By: Contributor(s): Material type: TextTextSeries: Artech House microwave libraryPublication details: Boston : Artech House, 2007.Description: xx, 301 p. : illISBN:
  • 9781580537100
Subject(s): Genre/Form: LOC classification:
  • TK7895.E42 K49 2007
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Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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