On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / Andrej Rumiantsev.

By:

Rumiantsev, Andrej [author.]

Material type: Text

TextSeries: River Publishers series in electronic materials and devicesPublisher: Gistrup, Denmark ; Delft, Netherlands : River Publishers, [2019]Copyright date: 2019Description: 1 online resource (278 pages)Content type:

text

Media type:

computer

Carrier type:

online resource

ISBN:

9788770221115 (e-book)

Subject(s):

Semiconductors -- Characterization

Genre/Form:

Electronic books.

Additional physical formats: Print version:: On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond.DDC classification:

621.38152 23

LOC classification:

TK7871.85 .R865 2019

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Description based on print version record.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / Andrej Rumiantsev.