000 02190nam a2200493 i 4500
001 EBC1701414
003 MiAaPQ
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006 m o d |
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008 140620t20142014gw a ob 001 0 eng d
020 _z9783527411528
020 _z9783527681099 (Mobi)
020 _z9783527681075 (oBook)
020 _a9783527681082
_q(electronic bk.)
020 _a9783527681105
_q(electronic bk.)
035 _a(MiAaPQ)EBC1701414
035 _a(Au-PeEL)EBL1701414
035 _a(CaPaEBR)ebr10881255
035 _a(CaONFJC)MIL615339
035 _a(OCoLC)881028799
040 _aMiAaPQ
_beng
_erda
_epn
_cMiAaPQ
_dMiAaPQ
050 4 _aQC415
_b.S478 2014
082 0 _a621.36
_223
100 1 _aServin, Manuel,
_eauthor.
_9602740
245 1 0 _aFringe pattern analysis for optical metrology :
_btheory, algorithms, and applications /
_cManuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
264 1 _aWeinheim, Germany :
_bWiley-VCH Verlag GmbH & Co. KGaA,
_c2014.
264 4 _c2014
300 _a1 online resource (345 pages) :
_billustrations
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
504 _aIncludes bibliographical references and index.
588 _aDescription based on online resource; title from PDF title page (ebrary, viewed June 19, 2014).
590 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aDiffraction patterns
_xData processing.
_9602741
650 0 _aImage processing
_xData processing.
_9602742
655 4 _aElectronic books.
_935142
700 1 _aQuiroga, J. Antonio,
_eauthor.
_9602743
700 1 _aPadilla, J. Moises,
_eauthor.
_9602744
776 0 8 _iPrint version:
_aServin, Manuel.
_tFringe pattern analysis for optical metrology : theory, algorithms, and applications.
_dWeinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, c2014
_hxvi, 327 pages
_z9783527411528
797 2 _aProQuest (Firm)
856 4 0 _uhttps://ebookcentral.proquest.com/lib/kuct-ebooks/detail.action?docID=1701414
_zClick to View
999 _c319761
_d319761